Ontash & Ermac, Inc. (O&E) develops and sells Spectral Induced Polarization (SIP) measurement equipment. SIP measurements are utilized to indirectly determine key earth media properties such as permeability, porosity, grain/pore distribution, and surface area.
O&E SIP development is performed in collaboration with the DEES, Rutgers University-Newark & aided by NSF Phase I, IB, II & IIB funding awards.